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High NA Solid Immersion Microscopy with Adaptive Optics

Aplanatic solid immersion lens (SIL) microscopy is required to achieve the highest possible resolution for next generation silicon IC backside inspection and failure analysis. However, aplanatic SILs are susceptible to spherical aberration introduced by substrate thickness mismatch. We have...

Deformable mirror control

a). Deformable mirror open loop control: I characterize the errors associated with open-loop control of a MEMS deformable mirror using an approach that combines sparse calibration of the electrostatic actuator state space with an elastic plate model of the mirror facesheet. The sources of...