Backside FA with SILs: Integrated Circuit Super-Resolution Failure Analysis with Solid Immersion Lenses
Vigil, Kyle, Yang Lu, Abdulkadir Yurt, Tenzile Berkin Cilingiroglu, Thomas G Bifano, Selim Unlu, and Bennett B Goldberg. 2014. “Backside FA With SILs: Integrated Circuit Super-Resolution Failure Analysis With Solid Immersion Lenses.”